Efficient spare allocation in reconfigurable arrays

Proceedings - Design Automation Conference

Volumn , Issue , 1986, Pages 385-390

  Kuo, Sy Yen ^a   Fuchs, W Kent ^a  

^a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BRANCH AND BOUND METHOD; HEURISTIC ALGORITHMS; PATTERN MATCHING;

BI-PARTITE GRAPH MATCHING; BRANCH-AND-BOUND APPROACHES; COMPLEXITY ANALYSIS; OPTIMAL RECONFIGURATIONS; PROCESSING ELEMENTS; RECONFIGURABLE ARRAY; RECTANGULAR ARRAYS; SEMICONDUCTOR MANUFACTURERS;

COMPUTER AIDED DESIGN;

EID: 80052649676     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DAC.1986.1586118     Document Type: Conference Paper

References (10)

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7. M. Tarr. D. Boudreau, and R. Murphy, "Defect Analysis System Speeds Text and Repair of Redundant Memories." Electronics, pp. 175-179. January 12, 1984.
8. J. R. Day, "A Fault-Driven, Comprehensive Redundancy Algorithm." IEEE Design A Test. pp. 35-44. June 1985.
9. C. H. Papadimitriou and K. Steiglitz. Combinatorial Optimization, Algorithms and Complexity. New Jersey: Prentice-Hall. Inc.. 1982.
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