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Volumn 130, Issue 1-2, 2011, Pages 760-768
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Structure-property relationship in aliphatic polyamide/polyaniline surface layered composites
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Author keywords
A. Composite materials; A. Interfaces; D. Dielectric properties; D. Electrical properties
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Indexed keywords
A. COMPOSITE MATERIALS;
A. INTERFACES;
ANILINE POLYMERIZATION;
CONDUCTING POLYMER COMPOSITES;
CONFOCAL RAMAN;
D. DIELECTRIC PROPERTIES;
DIELECTRIC PERMITTIVITIES;
ELECTRICAL PROPERTY;
HOST MATRICES;
IN-SITU;
INTERFACIAL POLARIZATION;
LAYERED COMPOSITES;
MOLECULAR CHAINS;
REAL PART;
STRUCTURE PROPERTY RELATIONSHIPS;
SURFACE LAYERS;
X-RAY DIFFRACTION STUDIES;
AMIDES;
ANILINE;
COMPOSITE MATERIALS;
CONDUCTIVE FILMS;
DIELECTRIC LOSSES;
DIELECTRIC MATERIALS;
ELECTRIC PROPERTIES;
NANOCOMPOSITE FILMS;
ORGANIC CONDUCTORS;
PERMITTIVITY;
POLYANILINE;
POLYMER FILMS;
POLYMERIZATION;
X RAY DIFFRACTION;
POLYMER MATRIX COMPOSITES;
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EID: 80052580352
PISSN: 02540584
EISSN: None
Source Type: Journal
DOI: 10.1016/j.matchemphys.2011.07.057 Document Type: Article |
Times cited : (20)
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References (51)
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