Type-I ELM power deposition profile width and temporal shape in JET

Journal of Nuclear Materials

Volumn 415, Issue 1 SUPPL, 2011, Pages

  Eich, T ^a,f   Thomsen, H ^a   Fundamenski, W ^b   Arnoux, G ^b   Brezinsek, S ^c   Devaux, S ^a   Herrmann, A ^a   Jachmich, S ^d   Rapp, J ^e  

^a MAX PLANCK INSTITUT FÜR PLASMAPHYSIK   (Germany)

^b CULHAM SCIENCE CENTRE   (United Kingdom)

^c FORSCHUNGSZENTRUM JÜLICH   (Germany)

^d ROYAL MILITARY ACADEMY   (Belgium)

^e FOM INSTITUTE FOR PLASMA PHYSICS RIJNHUIZEN   (Netherlands)

^f Culham Science Center   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

MATERIALS PROPERTIES; RADIOACTIVE MATERIALS;

DEPOSITED ENERGY; EMBEDDED THERMOCOUPLES; HIGH RESOLUTION; INFRA-RED CAMERAS; LOWER RESOLUTION; POWER DEPOSITION; TEMPORAL EVOLUTION; TEMPORAL SHAPE;

THERMOCOUPLES;

EID: 80052547200     PISSN: 00223115     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnucmat.2010.11.079     Document Type: Conference Paper

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12. S. Jachmich et al., these proceedings.