Microstructure of Sn 1-xPb xS grown by hot-wall technique

Physica Status Solidi (A) Applications and Materials Science

Volumn 208, Issue 9, 2011, Pages 2150-2158

  Wagner, Gerald ^a   Kaden, Ronny ^a   Lazenka, Vera ^b   Bente, Klaus ^a  

^a UNIVERSITY OF LEIPZIG   (Germany)

^b INSTITUTE OF SOLID STATE AND SEMICONDUCTOR PHYSICS   (Belarus)

Author keywords

defect structures; dislocations; TEM; tin lead sulfide; twist boundaries

Indexed keywords

CONTINUOUS LAYERS; DEPOSITED MATERIALS; GLASS SUBSTRATES; GROWTH DIRECTIONS; HRTEM IMAGES; ORTHOGONAL NETWORKS; PLASTIC RELAXATION; STRUCTURAL MODELS; TIN-LEAD-SULFIDE; TWIST BOUNDARIES; VLS MECHANISM;

DEFECT STRUCTURES; DEFECTS; LEAD; MODEL STRUCTURES; SCREW DISLOCATIONS; SUBSTRATES; WALLS (STRUCTURAL PARTITIONS);

TIN;

EID: 80052506998     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.201127019     Document Type: Article

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