Residual strain around grown-in defects in CVD diamond single crystals: A 2D and 3D Raman imaging study

Physica Status Solidi (A) Applications and Materials Science

Volumn 208, Issue 9, 2011, Pages 2038-2044

  Crisci, Alexandre ^a   Baillet, Francis ^a   Mermoux, Michel ^b   Bogdan, Ganna ^c   Nesládek, Milos ^c,d   Haenen, Ken ^c,d  

^a UNIV GRENOBLE ALPES   (France)

^b CNRS   (France)

^c HASSELT UNIVERSITY   (Belgium)

^d IMEC   (Belgium)

Author keywords

birefringence; CVD diamond; dislocations; Raman imaging

Indexed keywords

BIREFRINGENCE PATTERNS; CARBON PARTICLE; COMPRESSIVE STRAIN; CVD DIAMOND; DISLOCATION NUCLEATION; DISLOCATION WALLS; EPITAXIAL INTERFACES; GROWTH AXIS; HOMOEPITAXIAL FILMS; LINE INTENSITIES; OBSERVATION CONDITION; POLARIZED RAMAN; RAMAN IMAGES; RAMAN IMAGING; RESIDUAL STRAINS; SINGLE CRYSTAL DIAMOND; STRAIN INDUCED BIREFRINGENCE; STRUCTURAL FEATURE; TOMOGRAPHIC IMAGES;

BIREFRINGENCE; CHEMICAL VAPOR DEPOSITION; CRYSTAL GROWTH FROM VAPOR; DEFECTS; DIAMONDS; DIFFRACTIVE OPTICS; DISLOCATIONS (CRYSTALS); THREE DIMENSIONAL;

SINGLE CRYSTALS;

EID: 80052493649     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.201100039     Document Type: Article

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