Dimensional signature on noise-induced excitable statistics in an optically injected semiconductor laser

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 84, Issue 2, 2011, Pages

  Kelleher, B ^a,b   Goulding, D ^b,c   Huyet, G ^a,b   Viktorov, E A ^a,d   Erneux, T ^d   Hegarty, S P ^a,b  

^a Department of Chemistry   (Ireland)

^b UNIVERSITY COLLEGE CORK   (Ireland)

^c UNIVERSITY COLLEGE CORK   (Ireland)

^d UNIVERSITÉ LIBRE DE BRUXELLES   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

HOMOCLINIC BIFURCATIONS; INTENSITY MEASUREMENTS; MASTER LASERS; OPTICALLY INJECTED SEMICONDUCTOR LASER; PHASE EQUATION; SLAVE LASER;

BIFURCATION (MATHEMATICS); DYNAMICAL SYSTEMS; LASERS; NONLINEAR DYNAMICAL SYSTEMS;

SEMICONDUCTOR LASERS;

EID: 80052486999     PISSN: 15393755     EISSN: 15502376     Source Type: Journal    
DOI: 10.1103/PhysRevE.84.026208     Document Type: Article

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