Ion implantation induced modification of structural and magnetic properties of perpendicular media

Journal of Physics D: Applied Physics

Volumn 44, Issue 36, 2011, Pages

  Gaur, Nikita ^a,b   Piramanayagam, S N ^c   Maurer, S L ^c   Nunes, R W ^c   Steen, S ^c   Yang, H ^c   Bhatia, C S ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

^b DATA STORAGE INSTITUTE   (Singapore)

^c IBM T J WATSON RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARGON ION; BORON IONS; DOMAIN SIZE; DOSE IMPLANTATION; IMPLANTED LAYERS; INTRA-LAYER; MAGNETIC FORCE; OUT-OF-PLANE COERCIVITY; PERPENDICULAR MEDIA; PERPENDICULAR RECORDING MEDIA; RECORDING LAYERS; SOFT-UNDERLAYER; STRUCTURAL AND MAGNETIC PROPERTIES;

BORON; BORON COMPOUNDS; COERCIVE FORCE; ION IMPLANTATION; MAGNETIC FORCE MICROSCOPY; PHOTOELECTRON SPECTROSCOPY; SILICON COMPOUNDS; X RAY DIFFRACTION; X RAY PHOTOELECTRON SPECTROSCOPY;

IONS;

EID: 80052337424     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/44/36/365001     Document Type: Article

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