Using X-parameters to model diode-based RF power probes

IEEE MTT-S International Microwave Symposium Digest

Volumn , Issue , 2011, Pages

  Boaventura, Alírio S ^a   Testera, Alejandro R ^b   Carvalho, Nuno Borges ^a   Barciela, Mónica F ^b  

^a UNIVERSITY OF AVEIRO   (Portugal)

^b UNIVERSITY OF VIGO   (Spain)

Author keywords

Diode Power Probe; Nonlinear black box modeling; Poly Harmonic Model; Power Measurement; X parameters

Indexed keywords

BLACK-BOX MODELING; POLY-HARMONIC MODEL; RF-POWER; X-PARAMETERS;

PROBES;

DIODES;

EID: 80052306497     PISSN: 0149645X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSYM.2011.5972900     Document Type: Conference Paper

References (10)

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9. X-Parameter Measurements, http://na.tm.agilent.com/pna/nvna/NVNAWebHelp/ XParameter-Measurements.htm#config
10. X-parameters equations, http://edocs.soco.agilent.com/display/ads2009U1/ XnP+Components+%28X1P+-+X10P%29