Scanning electron microanalysis and analytical challenges of mapping elements in Urban atmospheric particles

Environmental Science and Technology

Volumn 45, Issue 17, 2011, Pages 7380-7386

  Conny, Joseph M ^a   Norris, Gary A ^b  

^a NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY   (United States)

^b U S ENVIRONMENTAL PROTECTION AGENCY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANALYTICAL CHALLENGE; ATLANTA; ATMOSPHERIC PARTICLES; BEAM ENERGIES; ELEMENTAL MAPPING; ELEMENTAL MAPS; ENERGY DISPERSIVE X-RAY SPECTROSCOPY; HIGH RESOLUTION; INDIVIDUAL PARTICLES; LOS ANGELES; LOW BEAM; MAJOR ELEMENTS; MASS ABSORPTION COEFFICIENT; MIXED PHASIS; OBLIQUE ANGLES; PARTICLE COMPOSITION; PARTICLE SHAPE; PARTICLE SURFACE ROUGHNESS; SCANNING ELECTRONS; SEATTLE; X-RAY MICROANALYSIS;

ABSORPTION; ENERGY DISPERSIVE SPECTROSCOPY; MICROANALYSIS; SCANNING ELECTRON MICROSCOPY; SURFACE ROUGHNESS;

MAPPING;

ABSORPTION COEFFICIENT; AIR SAMPLING; ARTIFACT; ATMOSPHERIC CHEMISTRY; HETEROGENEITY; PARTICULATE MATTER; QUALITATIVE ANALYSIS; SCANNING ELECTRON MICROSCOPY; SURFACE ROUGHNESS; TILT; URBAN ATMOSPHERE; X-RAY SPECTROSCOPY;

ABSORPTION; AIR QUALITY; ANALYTIC METHOD; ARTICLE; ELEMENTAL MAPPING; ENERGY DISPERSIVE X RAY SPECTROSCOPY; IMAGE ANALYSIS; PARTICLE SIZE; QUALITATIVE ANALYSIS; ROENTGEN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; UNITED STATES; URBAN AREA; X RAY MICROANALYSIS;

AIR POLLUTANTS; CITIES; ELECTRON PROBE MICROANALYSIS; ENVIRONMENTAL MONITORING; HUMANS; MICROSCOPY, ELECTRON, SCANNING; PARTICLE SIZE; SPECTROMETRY, X-RAY EMISSION; UNITED STATES;

ATLANTA; CALIFORNIA; GEORGIA; LOS ANGELES [CALIFORNIA]; SEATTLE; UNITED STATES; WASHINGTON [UNITED STATES];

EID: 80052238971     PISSN: 0013936X     EISSN: 15205851     Source Type: Journal    
DOI: 10.1021/es2009049     Document Type: Article

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