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Volumn , Issue , 2011, Pages 194-200
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Comparison of CMOS and a-Si flat panel imagers for X-ray imaging
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Author keywords
a Si technology; CMOS technology; flat panel detectors; passive and active pixel technology; X ray imagers
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Indexed keywords
A-SI TECHNOLOGY;
ACTIVE PIXEL;
CMOS TECHNOLOGY;
FLAT PANEL DETECTORS;
X-RAY IMAGERS;
AMORPHOUS SILICON;
CMOS INTEGRATED CIRCUITS;
CRYSTALLINE MATERIALS;
IMAGING SYSTEMS;
PIXELS;
POSITION MEASUREMENT;
SILICON;
SILICON DETECTORS;
X RAY ANALYSIS;
X RAYS;
COMPUTERIZED TOMOGRAPHY;
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EID: 80052180665
PISSN: None
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1109/IST.2011.5962217 Document Type: Conference Paper |
Times cited : (46)
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References (8)
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