SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 519, Issue 21, 2011, Pages 7615-7619

Optical constants of Na-In2S3 thin films prepared by vacuum thermal evaporation technique

(3) Timoumi, A a Bouzouita, H a Rezig, B a

a UNIVERSITY OF TUNIS EL MANAR (Tunisia)

Author keywords

In2S3; Optical constants; Thin films; Vacuum evaporation technique

Indexed keywords

COMPLEX DIELECTRIC CONSTANT; DEPOSITED FILMS; DISPERSION ENERGIES; DISPERSION PARAMETERS; EFFECTIVE MASS; ELECTRIC PERMITTIVITIES; EXTINCTION COEFFICIENTS; FREE CARRIERS; HIGH-FREQUENCY DIELECTRICS; OSCILLATION ENERGY; REFRACTIVE INDEX DISPERSION; SINGLE OSCILLATORS; SPECTRAL DATA; VACUUM EVAPORATION TECHNIQUE; VACUUM THERMAL EVAPORATION; VISIBLE RANGE; WAVELENGTH RANGES; WEMPLE-DIDOMENICO MODEL;

CARRIER CONCENTRATION; DISPERSION (WAVES); DISPERSIONS; INDIUM; LIGHT REFRACTION; OPTICAL CONSTANTS; PHASE TRANSITIONS; REFRACTIVE INDEX; REFRACTOMETERS; SODIUM; THERMAL EVAPORATION; THIN FILMS; VACUUM; VACUUM EVAPORATION;

OPTICAL FILMS;

EID: 80052152507 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2011.01.410 Document Type: Conference Paper

Times cited : (36)

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