PV module durability testing under high voltage biased damp heat conditions

Energy Procedia

Volumn 8, Issue , 2011, Pages 384-389

  Xiong, Zhengpeng ^a   Walsh, Timothy M ^a   Aberle, Armin G ^a  

^a NATIONAL UNIVERSITY OF SINGAPORE   (Singapore)

Author keywords

Damp heat; Durability; Electrical bias; Ion migration; Photovoltaic module

Indexed keywords

DISCOLORATION; HVDC POWER TRANSMISSION; METAL TESTING; PHOTOVOLTAIC CELLS; SILICON WAFERS; SURFACE DEFECTS; TESTING;

ACCELERATED AGEING TESTS; DAMP HEAT; ELECTRICAL BIAS; ELECTRICAL PERFORMANCE; ION MIGRATION; PHOTOVOLTAIC MODULES; SILICON-WAFER BASED TECHNOLOGY; THIN-FILM TECHNOLOGY;

DURABILITY;

EID: 80052099233     PISSN: 18766102     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1016/j.egypro.2011.06.154     Document Type: Conference Paper

References (5)

1. Osterwald CR, McMahon TJ, History of accelerated and qualification testing of terrestrial photovoltaic modules: A literature review, Progress in Photovoltaics 2009; 17, 11-33.
2. Osterwald CR, McMahon TJ, del Cueto JA, Electrochemical corrosion of SnO2:F transparent conducting layers in thin film photovoltaic modules, Solar Energy Materials & Solar Cells 2003:79: 21-33.
3. IEC 61215, Crystalline silicon terrestrial photovoltaic (PV) modules - Design qualification and type approval.
4. Swanson R., et.al., The surface polarization effect in high-efficiency silicon solar cells, Proceedings of the 15th International Photovoltaic Science & Engineering Conference, Shanghai: China; 2005, p. 410-411.
5. Shelby JE, Introduction to glass science and technology, 2nd ed., UK: 2005.