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Volumn 8, Issue , 2011, Pages 220-225
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Characterization of height-selective emitters
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Author keywords
Contact formation; Recombination; Selective emitter; Spin on
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Indexed keywords
CARRIER LIFETIME;
CHARACTERIZATION;
CRYSTALLITES;
SCANNING ELECTRON MICROSCOPY;
SHEET RESISTANCE;
SILICON WAFERS;
SILVER;
CARRIER LIFETIME MEASUREMENTS;
CONTACT FORMATION;
EMITTER SATURATION CURRENT DENSITY;
EMITTER SHEET RESISTANCE;
RECOMBINATION;
SELECTIVE EMITTERS;
SPIN-ON;
SURFACE RECOMBINATIONS;
OPEN CIRCUIT VOLTAGE;
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EID: 80052097995
PISSN: 18766102
EISSN: None
Source Type: Conference Proceeding
DOI: 10.1016/j.egypro.2011.06.127 Document Type: Conference Paper |
Times cited : (2)
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References (6)
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