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Volumn 8, Issue , 2011, Pages 706-711

High efficiency selective emitter cells using patterned ion implantation

Author keywords

Ion implant; Selective emitter; Silicon solar cell

Indexed keywords

DIFFUSION; EFFICIENCY; IONS; MANUFACTURE; PASSIVATION; SILICON IMPLANTS; SILICON SOLAR CELLS; SOLAR CELLS;

EID: 80052091908     PISSN: 18766102     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1016/j.egypro.2011.06.205     Document Type: Conference Paper
Times cited : (39)

References (8)
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    • Simple integral screenprinting process for selective emitter polycrystalline silicon solar cells
    • Szlufcik J, Elgamel HE, Ghannam M, Nijs J & Mertens R. Simple integral screenprinting process for selective emitter polycrystalline silicon solar cells. Appl. Phys. Lett. 1991; 59: p. 1583-4..
    • (1991) Appl. Phys. Lett. , vol.59 , pp. 1583-1584
    • Szlufcik, J.1    Elgamel, H.E.2    Ghannam, M.3    Nijs, J.4    Mertens, R.5
  • 3
    • 80052033976 scopus 로고    scopus 로고
    • Status of selective emitter technology
    • Valencia
    • th EU PVSEC/WCPEC-5, Valencia 2010, p.1091-6.
    • (2010) th EU PVSEC/WCPEC-5 , pp. 1091-1096
    • Hahn, G.1
  • 6
    • 0018517788 scopus 로고
    • 2 INTERFACE OXIDATION KINETICS: A PHYSICAL MODEL FOR THE INFLUENCE OF HIGH SUBSTRATE DOPING LEVELS - 2. COMPARISON WITH EXPERIMENT AND DISCUSSION.
    • Ho CP, Plummer JD. Si/SiO2 interface oxidation kinetics: a physical model for the influence of high substrate doping levels. II. Comparison with experiment and discussion. J. Electrochem. Soc. 1979; 126: p. 1523-30. (Pubitemid 10409000)
    • (1979) Journal of the Electrochemical Society , vol.126 , Issue.9 , pp. 1523-1530
    • Ho, C.P.1    Plummer, J.D.2
  • 7
    • 0018515262 scopus 로고
    • Si/SiO2 interface oxidation kinetics: A physical model for the influence of high substrate doping levels. I. Theory
    • Ho CP, Plummer JD. Si/SiO2 interface oxidation kinetics: a physical model for the influence of high substrate doping levels. I. Theory. J. Electrochem. Soc. 1979; 126, p. 7516-22.
    • (1979) J. Electrochem. Soc. , vol.126 , pp. 7516-7522
    • Ho, C.P.1    Plummer, J.D.2
  • 8
    • 85031220820 scopus 로고    scopus 로고
    • Low RJ, Gupta A, Dubé CE, Tsefrekas B, Skinner W, Mullin J. to be published
    • Low RJ, Gupta A, Dubé CE, Tsefrekas B, Skinner W, Mullin J. to be published.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.