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Volumn 8, Issue , 2011, Pages 461-466

Influence of thickness deviation on crystalline silicon solar cell performance

Author keywords

Contact resistance; Infrared transmission; Multidiode model; String ribbon; Thickness deviation

Indexed keywords

CONTACT RESISTANCE; CRYSTALLINE MATERIALS; EFFICIENCY; INFRARED RADIATION; INFRARED TRANSMISSION; SILICON; SILICON WAFERS; SOLAR CELLS;

EID: 80052086932     PISSN: 18766102     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1016/j.egypro.2011.06.166     Document Type: Conference Paper
Times cited : (2)

References (9)
  • 1
    • 0022986386 scopus 로고
    • Edge stabilized ribbon (ESR) growth of silicon for low cost photovoltaics
    • EM Sachs, D Ely and J Serdy, Edge stabilized ribbon (ESR) growth of silicon for low cost photovoltaics, Journal of Crystal Growth 82, 117-121 (1987).
    • (1987) Journal of Crystal Growth , vol.82 , pp. 117-121
    • Sachs, E.M.1    Ely, D.2    Serdy, J.3
  • 2
    • 80052098739 scopus 로고    scopus 로고
    • Low-cost manufacturing of high-efficiency, high-reliability string ribbon Si PV modules
    • Evergreen Solar Inc. Marlboro, Massachusetts
    • L Felton, Low-Cost Manufacturing of High-Efficiency, High-Reliability String Ribbon Si PV Modules, Subcontract Report NREL/SR-520-45902 (Evergreen Solar Inc., Marlboro, Massachusetts, 2009), p. 41.
    • (2009) Subcontract Report NREL/SR-520-45902 , pp. 41
    • Felton, L.1
  • 3
    • 0013011909 scopus 로고
    • Research and investigation of inverse epitaxial UHF power transistors
    • Wright Patterson Air Force Base, Ohio
    • W Shockley, Research and Investigation of Inverse Epitaxial UHF Power Transistors, Report A1-TOR-64-207 (Air Force Avionics Laboratory, Wright Patterson Air Force Base, Ohio, 1964).
    • (1964) Report A1-TOR-64-207, Air Force Avionics Laboratory
    • Shockley, W.1
  • 7
    • 0042257182 scopus 로고    scopus 로고
    • Contact resistance scanning for process optimization: The corescanner method
    • edited by H. Scheer, B. McNelis, W. Palz, H. Ossenbrink and P. Helm (James & James Ltd.London, UK
    • ASH van der Heide, A Schönecker, GP Wyers and WC Sinke, Contact Resistance Scanning for Process Optimization: The Corescanner Method in Proc. 16th EuPVSEC, edited by H. Scheer, B. McNelis, W. Palz, H. Ossenbrink and P. Helm (James & James Ltd., London, UK, 2000), p. 1438.
    • (2000) Proc. 16th EuPVSEC , pp. 1438
    • Van Der Heide, A.S.H.1    Schönecker, A.2    Wyers, G.P.3    Sinke, W.C.4
  • 8
  • 9
    • 0019597775 scopus 로고
    • Solar cell fill factors: General graph and empirical expressions
    • MA Green, Solar cell fill factors: General graph and empirical expressions, Solid-State Electronics 24, 788-789 (1981).
    • (1981) Solid-State Electronics , vol.24 , pp. 788-789
    • Green, M.A.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.