SCOPUS 정보 검색 플랫폼

Energy Procedia

Volumn 8, Issue , 2011, Pages 565-570

The origin of background plating

(4) Braun, Stefan a Zuschlag, Annika a Raabe, Bernd a Hahn, Giso a

a UNIVERSITY OF KONSTANZ (Germany)

Author keywords

Background plating; Copper; Nickel; Shading; Shunting

Indexed keywords

COPPER; CRYSTALLINE MATERIALS; ION BEAMS; METALLIZING; METALS; NICKEL; SCANNING ELECTRON MICROSCOPY; SCREEN PRINTING; SILICON; SILICON NITRIDE; SILICON SOLAR CELLS; SILVER; THICK FILMS;

CONTACT PROPERTIES; CRYSTALLINE SILICON SOLAR CELLS; DIFFERENT ORIGINS; EMITTER STRUCTURES; METALLIZATION TECHNIQUES; SCREEN-PRINTING PROCESS; SHADING; SHUNTING;

PLATING;

EID: 80052083075 PISSN: 18766102 EISSN: None Source Type: Conference Proceeding
DOI: 10.1016/j.egypro.2011.06.183 Document Type: Conference Paper

Times cited : (18)

References (6)

1
- 55649122861
- Fineline printed silicon solar cells exceeding 20% efficiency
- Hörteis M, Glunz SW. Fineline printed silicon solar cells exceeding 20% efficiency. Progr Photovolt Res Appl 2008;16:555- 600.
- (2008) Progr Photovolt Res Appl , vol.16 , pp. 555-600
- Hörteis, M.¹ Glunz, S.W.²

2
- 80052099019
- Electroless nickel and copper metallization: Contact formation on crystalline silicon and background plating behavior on PECVD SiNx:H layers
- Valencia
- th EU-PVSEC, Valencia 2010, p. 1892-5.
- (2010) th EU-PVSEC , pp. 1892-1895
- Braun, S.¹ Emre, E.² Raabe, B.³ Hahn, G.⁴

3
- 0036778164
- Ni/Cu metallization for low-cost high-efficiency PERC cells
- Lee E, Kim DS, Lee SH. Ni/Cu metallization for low-cost high-efficiency PERC cells. Solar Energy Materials & Solar Cells 2002;74;65-70.
- (2002) Solar Energy Materials & Solar Cells , vol.74 , pp. 65-70
- Lee, E.¹ Kim, D.S.² Lee, S.H.³

4
- 80052099563
- Relevant pinhole characterisation method for dielectric layers for silicon solar cells
- Hamburg
- th EU-PVSEC, Hamburg 2009, p. 2084-7.
- (2009) th EU-PVSEC , pp. 2084-2087
- Cast, P.¹ Tanay, F.² Alemán, M.³

5
- 0141483968
- New York: Kluwer Accademic/Plenum Publishers
- Orloff J, Utlaut M, Swanson L. High Resolution Focused Ion Beams: FIB and its Applications. New York: Kluwer Accademic/Plenum Publishers; 2003.
- (2003) High Resolution Focused Ion Beams: FIB and Its Applications
- Orloff, J.¹ Utlaut, M.² Swanson, L.³

6
- 80052095959
- A new concept to produce a random pyramid texture on monocrystalline silicon at elevated process temperatures and shortened process times
- Hamburg
- th EU-PVSEC, Hamburg 2009, p. 1958-1960.
- (2009) th EU-PVSEC , pp. 1958-1960
- Ximello, N.¹ Haverkamp, H.² Hahn, G.³

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.