Polarized spectroscopic properties of Ho3+-doped LuLiF 4 single crystal for 2 μm and 2.9 μm lasers

Optical Materials

Volumn 33, Issue 11, 2011, Pages 1610-1615

  Zhao, Chengchun ^a,b   Hang, Yin ^a   Zhang, Lianhan ^a   Yin, Jigang ^a,b   Hu, Pengchao ^a,b   Ma, En ^c  

^a SHANGHAI INSTITUTE OF OPTICS AND FINE MECHANICS   (China)

^b UNIVERSITY OF CHINESE ACADEMY OF SCIENCES   (China)

^c INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

Czochralski method; Laser materials; Spectral properties

Indexed keywords

CRYSTAL GROWTH FROM MELT; EMISSION SPECTROSCOPY; EXCITED STATES; HOLMIUM COMPOUNDS; LITHIUM COMPOUNDS; LUTETIUM COMPOUNDS; SINGLE CRYSTALS;

EMISSION PROBABILITIES; FLUORESCENCE LIFETIMES; LASER MATERIALS; POLARIZATION CHARACTERISTICS; POLARIZED SPECTROSCOPIC PROPERTIES; SPECTRAL PROPERTIES; STIMULATED EMISSION CROSS SECTION; TEMPERATURE ABSORPTION;

FLUORINE COMPOUNDS;

EID: 80052008491     PISSN: 09253467     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.optmat.2011.04.010     Document Type: Article

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