Real-time ellipsometric characterization of initial growth stage of poly(3,4-ethylene dioxythiophene):poly(styrene sulfonic acid) films by electrospray deposition

Japanese Journal of Applied Physics

Volumn 50, Issue 8 PART 1, 2011, Pages

  Ino, Tomohisa ^a   Asano, Takashi ^a   Fukuda, Takeshi ^a   Ueno, Keiji ^a   Shirai, Hajime ^a  

^a SAITAMA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION PRECURSORS; ELECTROSPRAY DEPOSITION; GROWING SURFACES; GROWTH STAGES; PEDOT:PSS; POLY(3 ,4-ETHYLENEDIOXYTHIOPHENE); SPECTRA ANALYSIS; SULFONIC ACID;

COALESCENCE; CONDUCTING POLYMERS; ETHYLENE; MONOLAYERS; NUCLEATION; SPECTROSCOPIC ELLIPSOMETRY; STYRENE; SURFACE ROUGHNESS;

SURFACES;

EID: 80051974504     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.50.081603     Document Type: Article

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