Statistical methods and measurement

Guide to Advanced Empirical Software Engineering

Volumn , Issue , 2008, Pages 155-184

  Rosenberg, Jarrett ^a  

^a SUN MICROSYSTEMS   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 80051971408     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1007/978-1-84800-044-5_6     Document Type: Chapter

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