Efficient, sensitivity resistant binary instrumentation

2011 International Symposium on Software Testing and Analysis, ISSTA 2011 - Proceedings

Volumn , Issue , 2011, Pages 89-99

  Bernat, Andrew R ^a   Roundy, Kevin ^a   Miller, Barton P ^a  

^a University of Wisconsin   (United States)

Author keywords

binary instrumentation; binary rewriting; binary slicing; dynamic instrumentation; malware analysis; static analysis

Indexed keywords

BINARY INSTRUMENTATIONS; BINARY REWRITING; BINARY SLICING; DYNAMIC INSTRUMENTATION; MALWARE ANALYSIS;

COMPUTER SOFTWARE SELECTION AND EVALUATION; COST BENEFIT ANALYSIS; INSTRUMENTS; PROGRAM DEBUGGING; SEMANTICS; SOFTWARE TESTING; SPECIFICATIONS; STRUCTURAL ANALYSIS;

STATIC ANALYSIS;

EID: 80051950485     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/2001420.2001432     Document Type: Conference Paper

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