Impedance and Raman spectroscopic studies of (Na0.5Bi 0.5)TiO3

Journal of Physics D: Applied Physics

Volumn 44, Issue 35, 2011, Pages

  Barick, B K ^a   Mishra, K K ^b   Arora, A K ^b   Choudhary, R N P ^c   Pradhan, Dillip K ^a  

^a NATIONAL INSTITUTE OF TECHNOLOGY   (India)

^b INDIRA GANDHI CENTRE FOR ATOMIC RESEARCH   (India)

^c SIKSHA O ANUSANDHAN DEEMED TO BE UNIVERSITY   (India)

Author keywords

[No Author keywords available]

Indexed keywords

AC CONDUCTIVITY; ARRHENIUS; BULK CONDUCTIVITIES; CONDUCTION MECHANISM; DIELECTRIC STUDIES; DIFFUSE PHASE TRANSITIONS; FREQUENCY EXPONENT; HIGH TEMPERATURE; HIGH TEMPERATURE SOLID-STATE REACTION; HIGHER TEMPERATURES; IMPEDANCE SPECTROSCOPY; IN-SITU; INTERMEDIATE TEMPERATURES; LATTICE MODES; LOW TEMPERATURES; PHONON FREQUENCIES; POLYCRYSTALLINE; POLYCRYSTALLINE POWDERS; POWER LAW; PREEXPONENTIAL FACTOR; RAMAN SPECTROSCOPIC STUDY; RHOMBOHEDRAL CRYSTALS; ROOM TEMPERATURE; SCANNING ELECTRON MICROGRAPHS; SINGLE-PHASE COMPOUND; SMALL POLARONS; TEMPERATURE DEPENDENT; THERMALLY ACTIVATED PROCESS; TIO;

ACTIVATION ENERGY; OXYGEN VACANCIES; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SODIUM; SPECTROSCOPIC ANALYSIS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

BISMUTH COMPOUNDS;

EID: 80051949482     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/44/35/355402     Document Type: Article

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