Structure and magnetic properties of mono- and bi-layer graphene films on ultraprecision figured 4H-SiC(0001) surfaces

Journal of Nanoscience and Nanotechnology

Volumn 11, Issue 4, 2011, Pages 2897-2902

  Hattori, Azusa N ^a   Okamoto, Takeshi ^a   Sadakuni, Shun ^a   Murata, Junji ^a   Oi, Hideo ^b   Arima, Kenta ^a   Sano, Yasuhisa ^a   Hattori, Ken ^b   Daimon, Hiroshi ^b   Endo, Katsuyoshi ^a   Yamauchi, Kazuto ^a  

^a OSAKA UNIVERSITY   (Japan)

^b NARA INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

Author keywords

Graphene; Low energy electron diffraction; Magnetic property; SiC; X Ray photoelectron spectroscopy

Indexed keywords

BILAYER GRAPHENE; CHEMICAL BONDINGS; GRAPHENE FILMS; GRAPHENE LAYERS; INTENSITY DISTRIBUTION; MAGNETO-OPTIC KERR EFFECT; SIC; ULTRA PRECISION;

ATOMIC FORCE MICROSCOPY; CHEMICAL BONDS; LOW ENERGY ELECTRON DIFFRACTION; MAGNETIC PROPERTIES; MONOLAYERS; PHOTOELECTRONS; RAMAN SPECTROSCOPY; SCANNING TUNNELING MICROSCOPY; SILICON CARBIDE; X RAY PHOTOELECTRON SPECTROSCOPY;

GRAPHENE;

GRAPHITE; INORGANIC COMPOUND; NANOMATERIAL; SILICON CARBIDE; SILICON DERIVATIVE;

ARTICLE; ARTIFICIAL MEMBRANE; CHEMISTRY; CONFORMATION; CRYSTALLIZATION; MACROMOLECULE; MAGNETISM; MATERIALS TESTING; METHODOLOGY; PARTICLE SIZE; SURFACE PROPERTY; ULTRASTRUCTURE;

CARBON COMPOUNDS, INORGANIC; CRYSTALLIZATION; GRAPHITE; MACROMOLECULAR SUBSTANCES; MAGNETICS; MATERIALS TESTING; MEMBRANES, ARTIFICIAL; MOLECULAR CONFORMATION; NANOSTRUCTURES; PARTICLE SIZE; SILICON COMPOUNDS; SURFACE PROPERTIES;

EID: 80051931605     PISSN: 15334880     EISSN: 15334899     Source Type: Journal    
DOI: 10.1166/jnn.2011.3893     Document Type: Article

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