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Volumn 3, Issue 6, 2011, Pages 1045-1050

Aberration-corrected Analytical Microscopy Characterization of Double-Supported WO3/TiO2/SiO2 Solid Acid Catalysts

Author keywords

Catalysts; Electron energy loss spectroscopy; Electron microscopy; High resolution STEM imaging; Oxide

Indexed keywords


EID: 80051810296     PISSN: 18673880     EISSN: 18673899     Source Type: Journal    
DOI: 10.1002/cctc.201000273     Document Type: Article
Times cited : (5)

References (30)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.