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Volumn 83, Issue 16, 2011, Pages 6363-6367

Tandem ion trap design with enhanced mass analysis capabilities for large populations of ions

Author keywords

[No Author keywords available]

Indexed keywords

BUFFER GAS; ION TRAPS; LARGE POPULATION; MASS ACCURACY; MASS ANALYSIS; MASS DIFFERENCE; QUADRUPOLE ION TRAPS; RADIO FREQUENCIES; RESIDENCE TIME; SPACE CHARGE EFFECTS;

EID: 80051770341     PISSN: 00032700     EISSN: None     Source Type: Journal    
DOI: 10.1021/ac201285n     Document Type: Article
Times cited : (11)

References (11)
  • 7
    • 80051736911 scopus 로고    scopus 로고
    • U.S. Patent 6,627,876, September 30
    • Hager, J. W. U.S. Patent 6,627,876, September 30, 2003.
    • (2003)
    • Hager, J.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.