Rapid formation of dielectric surface flashover due to pulsed high power microwave excitation

IEEE Transactions on Dielectrics and Electrical Insulation

Volumn 18, Issue 4, 2011, Pages 964-970

  Foster, J ^a   Beeson, S ^a   Thomas, M ^a   Krile, J ^a   Krompholz, H ^a   Neuber, A ^a  

^a Texas Tech University   (United States)

Author keywords

dielectric breakdown; HPM; Microwave discharges; statistics of breakdown

Indexed keywords

ATMOSPHERIC CONDITIONS; DELAY TIME; DIELECTRIC SURFACE; DIELECTRIC SURFACE FLASHOVER; EXPERIMENTAL SETUP; FIELD ENHANCEMENT; HIGH POWER MICROWAVES; HIGH-FIELD REGIONS; HPM; MICROWAVE DISCHARGES; RADIOACTIVE SOURCES; SEED ELECTRONS; SOURCE OF ELECTRONS; SPATIAL DENSITIES; SURFACE FLASHOVER; TIME RESOLVED IMAGING; UV SOURCES;

DIELECTRIC DEVICES; ELECTRIC EXCITATION; ELECTRIC FIELDS; ELECTRONS; FLASHOVER; MICROWAVE DEVICES; RADIOACTIVE MATERIALS; RADIOACTIVITY; SURFACE DISCHARGES; SURFACES;

ATMOSPHERICS;

EID: 80051719277     PISSN: 10709878     EISSN: None     Source Type: Journal    
DOI: 10.1109/TDEI.2011.5976082     Document Type: Article

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