메뉴 건너뛰기




Volumn 22, Issue 9, 2011, Pages

Characterization of a traceable profiler instrument for areal roughness measurement

Author keywords

areal roughness measurement; calibration of depth setting standards; calibration of roughness standards; tactile measurement; traceable profiler

Indexed keywords

ACTUATORS; BEARINGS (MACHINE PARTS); CALIBRATION; COMPUTER PROGRAMMING LANGUAGES; DATA ACQUISITION; INTERFEROMETERS;

EID: 80051679645     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/22/9/094019     Document Type: Article
Times cited : (26)

References (6)
  • 1
    • 85034770261 scopus 로고    scopus 로고
    • VDI 2010 Optical measurement of microtopography, calibration of interference microscopes and depth setting standards for roughness measurement
    • VDI 2010 Optical measurement of microtopography, calibration of interference microscopes and depth setting standards for roughness measurement VDI/VDE-Handbuch Produktionstechnik und Fertigungsverfahren, Band 3: Betriebsmittel VDI/VDE-Richtlinie 2655 Part 1.1
    • Handbuch Produktionstechnik und Fertigungsverfahren


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.