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Volumn 85, Issue 4, 2011, Pages 551-558

Structural, optical and electrical properties of tin oxide thin film deposited by APCVD method

Author keywords

APCVD; Electrical property; Optical property; RBS; Tin oxde; XRD

Indexed keywords


EID: 80051655462     PISSN: 09731458     EISSN: 09749845     Source Type: Journal    
DOI: 10.1007/s12648-011-0058-y     Document Type: Article
Times cited : (20)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.