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Volumn 85, Issue 4, 2011, Pages 551-558
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Structural, optical and electrical properties of tin oxide thin film deposited by APCVD method
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Author keywords
APCVD; Electrical property; Optical property; RBS; Tin oxde; XRD
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Indexed keywords
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EID: 80051655462
PISSN: 09731458
EISSN: 09749845
Source Type: Journal
DOI: 10.1007/s12648-011-0058-y Document Type: Article |
Times cited : (20)
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References (17)
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