Achieving reduced cycle times in semiconductor manufacturing via effective control of the P-K equation factors

IFAC Proceedings Volumes (IFAC-PapersOnline)

Volumn 12, Issue PART 1, 2006, Pages

  Kalir, Adar ^a   Bouhnik, Sylvain ^a  

^a INTEL CORPORATION   (United States)

Author keywords

Cycle time; DOE; Simulation; Variability; WIP management

Indexed keywords

DESIGN OF EXPERIMENTS;

COEFFICIENT OF VARIABILITY; CYCLE TIME; EQUIPMENT PERFORMANCE IMPROVEMENTS; SEMICONDUCTOR FACTORIES; SEMICONDUCTOR MANUFACTURING; SIMULATION; VARIABILITY; WIP MANAGEMENTS;

SEMICONDUCTOR DEVICE MANUFACTURE;

EID: 79961203078     PISSN: 14746670     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.3182/20060517-3-fr-2903.00041     Document Type: Conference Paper

References (5)

1. Daniely, D., Kalir, A., Lopez, P., and A. Terry, (2005). Effective Utilization (Ue) - A Breakthrough Performance Indicator for Machine Efficiency Improvement, Proceedings of the 14th Int. Conf. on Semiconductor Manufacturing (ISSM), San Jose, CA, USA, pp. 63-66.
2. Hopp, W.J. and Spearman M.L. (1996), Factory Physics, McGraw-Hill.
3. Ignizio, J.P. (2005). Fast Cycle Time: Why It's Important and How We Can Achieve It, Internal Working Paper, Intel Corporation.
4. nd IIERM Proceedings, Tel-Aviv, Israel, pp. 92-106.
5. Kalir, A., Zorea, Y., and E. Stebbins (2005), MPLM: A Novel Breakthrough System for Mixed Production Goaling and Detailed Shift Planning, 3rd Int. Conf. on Modeling and Analysis of Semiconductor Manufacturing, Singapore, pp. 181-187.