Optics upgrades at the APS beamline 20-BM

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 649, Issue 1, 2011, Pages 128-130

  Heald, Steve M ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

Focusing; Microfocusing; Reflectivity; X ray optics

Indexed keywords

BEAM LINES; DIFFERENTIAL COATINGS; ENERGY RANGES; FOCAL SPOT; FOCUSED BEAMS; FOCUSING MIRRORS; GOOD REFLECTIVITY; MICROFOCUSING; SLOPE ERRORS;

COATINGS; FOCUSING; PLATINUM; REFLECTION;

MIRRORS;

EID: 79961172473     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2010.11.070     Document Type: Conference Paper

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3. P.J. Eng, M. Newville, M.L. Rivers, and S.R. Sutton Proc. SPIE 3449 1998 145 156