NIST NSLS-II spectroscopy beamline optical plan for soft and tender X-ray spectroscopy and microscopy (100 eV to 7.5 keV)

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 649, Issue 1, 2011, Pages 49-51

  Reininger, R ^a   Woicik, J C ^b   Hulbert, S L ^b   Fischer, D A ^b  

^a Scientific Answers and Solutions   (United States)

^b BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

Beamline; Canted undulators; Soft X rays; Tender X rays

Indexed keywords

BEAM LINES; CONTINUOUS SELECTION; EXPERIMENTAL STATIONS; SOFT X-RAY; TENDER X-RAYS; X-RAY SOURCES;

SUN; X RAY LITHOGRAPHY; X RAY PHOTOELECTRON SPECTROSCOPY; X RAY SPECTROSCOPY;

WIGGLERS;

EID: 79961170072     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2010.11.172     Document Type: Conference Paper

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