Three dimensional optical modeling of amorphous silicon thin film solar cells using the finite-difference time-domain method including real randomly surface topographies

Journal of Applied Physics

Volumn 110, Issue 2, 2011, Pages

  Lacombe, Jürgen ^a   Sergeev, Oleg ^a   Chakanga, Kambulakwao ^a   Von Maydell, Karsten ^a   Agert, Carsten ^a  

^a NEXT ENERGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON THIN FILMS; EXPERIMENTAL DATA; EXTERNAL QUANTUM EFFICIENCY; FITTING PARAMETERS; LIGHT TRAPPING EFFECTS; OPTICAL GENERATION; OPTICAL MODELING; ROUGH INTERFACES; SEMICONDUCTOR LAYERS; SILICON THIN FILM; SYNOPSYS; THREE DIMENSIONAL SYSTEMS; TOPOGRAPHY MEASUREMENT; TRANSPARENT CONDUCTING OXIDE;

AMORPHOUS FILMS; AMORPHOUS SILICON; ANGULAR DISTRIBUTION; FINITE DIFFERENCE TIME DOMAIN METHOD; LIGHT PROPAGATION; SEMICONDUCTING SILICON COMPOUNDS; THIN FILMS; THREE DIMENSIONAL;

TIME DOMAIN ANALYSIS;

EID: 79961117687     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3610516     Document Type: Article

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