Determination of interfacial thermal resistance at the nanoscale

Physical Review B - Condensed Matter and Materials Physics

Volumn 83, Issue 19, 2011, Pages

  Hu, Lin ^a   Desai, Tapan ^b   Keblinski, Pawel ^a  

^a RENSSELAER POLYTECHNIC INSTITUTE   (United States)

^b Advanced Cooling Technologies Inc   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 79961116183     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.83.195423     Document Type: Article

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