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Physical Review B - Condensed Matter and Materials Physics

Volumn 83, Issue 19, 2011, Pages

Atomic migration and bonding characteristics during a glass transition investigated using as-cast Zr-Cu-Al

(6) Fan, C a Ren, Y b Liu, C T c Liaw, P K d Yan, H G a Egami, T d

a HUNAN UNIVERSITY (China)

b ARGONNE NATIONAL LABORATORY (United States)

c CITY UNIVERSITY OF HONG KONG (Hong Kong)

d University of Tennessee (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 79961101671 PISSN: 10980121 EISSN: 1550235X Source Type: Journal
DOI: 10.1103/PhysRevB.83.195207 Document Type: Article

Times cited : (22)

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