Substrate temperature dependence of the structure of polythiophene thin films obtained by Matrix Assisted Pulsed Laser Evaporation (MAPLE)

EPJ Applied Physics

Volumn 48, Issue 1, 2009, Pages

  Califano, V ^a,c   Bloisi, F ^a   Vicari, L ^a   Barra, M ^a   Cassinese, A ^a   Fanelli, E ^a   Buzio, R ^b,d   Valbusa, U ^b   Carella, A ^a   Roviello, A ^a  

^a UNIVERSITY OF NAPLES FEDERICO II   (Italy)

^b UNIVERSITY OF GENOA   (Italy)

^c ISTITUTO MOTORI CNR   (Italy)

^d Laboratory of Innovative and Artificial Materials Genoa   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

DEGREE OF ORDER; ELECTRICAL MEASUREMENT; FOURIER TRANSFORM INFRARED; FROZEN SOLUTIONS; FTIR; HOT SURFACE; INFORMATION CONCERNING; MATRIX ASSISTED PULSED LASER EVAPORATION; POLY-THIOPHENE; REGIO-REGULAR; ROOM TEMPERATURE; STACKED STRUCTURE; STRUCTURAL ORDERS; SUBSTRATE TEMPERATURE; SUBSTRATE TEMPERATURE DEPENDENCE; UV-VISIBLE;

ATOMIC FORCE MICROSCOPY; ELECTRIC PROPERTIES; EVAPORATION; INFRARED LASERS; IRRADIATION; PHASE TRANSITIONS; POLYMER FILMS; POLYMERS; SPECTROSCOPIC ANALYSIS; STRUCTURE (COMPOSITION); SUBSTRATES; THIN FILMS; THIOPHENE; TRANSPORT PROPERTIES;

PULSED LASERS;

EID: 79961100475     PISSN: 12860042     EISSN: 12860050     Source Type: Journal    
DOI: 10.1051/epjap/2009130     Document Type: Article

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