Incorporation of the effect of the composite electric fields of molecular ions as a simulation tool for biological damage due to heavy-ion irradiation

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 84, Issue 1, 2011, Pages

  Moribayashi, Kengo ^a,b  

^a JAPAN ATOMIC ENERGY AGENCY   (Japan)

^b DOSHISHA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC AND MOLECULAR PROCESS; DNA DAMAGES; ELECTRON-IMPACT IONIZATION; MOLECULAR IONS; SIMULATION TOOL; STRONG ELECTRIC FIELDS; THEORETICAL STUDY;

HEAVY IONS; IMPACT IONIZATION; IRRADIATION;

ELECTRIC FIELDS;

EID: 79961079506     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.84.012702     Document Type: Article

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