Interpretation of dark-field contrast and particle-size selectivity in grating interferometers

Applied Optics

Volumn 50, Issue 22, 2011, Pages 4310-4319

  Lynch, Susanna K ^a   Pai, Vinay ^a   Auxier, Julie ^b   Stein, Ashley F ^c   Bennett, Eric E ^a   Kemble, Camille K ^a   Xiao, Xianghui ^d   Lee, Wah Keat ^d   Morgan, Nicole Y ^a   Wen, Han Harold ^a  

^a NATIONAL HEART LUNG AND BLOOD INSTITUTE   (United States)

^b Oregon State University   (United States)

^c HARVARD MEDICAL SCHOOL   (United States)

^d ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTERIZED TOMOGRAPHY; REFRACTIVE INDEX; WAVE PROPAGATION; X RAY ABSORPTION;

BEAM-SPLITTER GRATINGS; COMPLEX REFRACTIVE INDEX; FITTING PARAMETERS; GRATING INTERFEROMETERS; INTERFERENCE FRINGE; SMALL ANGLE SCATTERING; WAVE CALCULATIONS; WAVE PROPAGATION MODELS;

PARTICLE SIZE;

FERRIC ION; FERRIC OXIDE; METAL NANOPARTICLE; MICROSPHERE;

ARTICLE; COMPUTER ASSISTED DIAGNOSIS; COMPUTER ASSISTED TOMOGRAPHY; IMAGE PROCESSING; INTERFEROMETRY; LIGHT RELATED PHENOMENA; METHODOLOGY; PARTICLE SIZE; PHASE CONTRAST MICROSCOPY; REFRACTOMETRY; STATISTICS; THEORETICAL MODEL; THREE DIMENSIONAL IMAGING; X RAY;

FERRIC COMPOUNDS; IMAGE PROCESSING, COMPUTER-ASSISTED; IMAGING, THREE-DIMENSIONAL; INTERFEROMETRY; METAL NANOPARTICLES; MICROSCOPY, PHASE-CONTRAST; MICROSPHERES; MODELS, THEORETICAL; OPTICAL PHENOMENA; PARTICLE SIZE; RADIOGRAPHIC IMAGE INTERPRETATION, COMPUTER-ASSISTED; REFRACTOMETRY; TOMOGRAPHY, X-RAY COMPUTED; X-RAYS;

EID: 79961077394     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.50.004310     Document Type: Article

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