Universal velocity-field characteristics for a nanowire arbitrary degeneracy

AIP Conference Proceedings

Volumn 1347, Issue , 2011, Pages 157-160

  Chek, Desmond C Y ^a   Tan, Michael Loong Peng ^a,c   Hashim, Abdul Manaf ^a   Arora, Vijay K ^a,b  

^a UNIVERSITI TEKNOLOGI MALAYSIA   (Malaysia)

^b WILKES UNIVERSITY   (United States)

^c UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

degeneracy; drift velocity; high field effect; Nanowire; quantum emission

Indexed keywords

EID: 79961071465     PISSN: 0094243X     EISSN: 15517616     Source Type: Conference Proceeding    
DOI: 10.1063/1.3586975     Document Type: Conference Paper

References (4)

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4. D. L. Scharfetter and H. K. Gummel, IEEE Transactions on Electron Devices, vol. 16, pp. 64-77, 1969.