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Volumn 52, Issue 17, 2011, Pages 3865-3870

A study on the crystallization behavior of poly(β-hydroxybutyrate) thin films on Si wafers

Author keywords

Crystal orientation; Grazing incidence X ray diffraction (GIXD); Thickness dependence

Indexed keywords

CRYSTALLIZATION; INTERFACES (MATERIALS); MOLECULAR ORIENTATION; SILICON WAFERS; TEMPERATURE DISTRIBUTION; ULTRATHIN FILMS; X RAY DIFFRACTION;

EID: 79961028127     PISSN: 00323861     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.polymer.2011.06.024     Document Type: Article
Times cited : (47)

References (55)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.