Resolving bulk and grain boundary transport properties of TiO 2 thin films enabled by laser-induced anisotropic morphology

Advanced Materials

Volumn 23, Issue 29, 2011, Pages 3266-3271

  Ankonina, Guy ^a   Chung, Ui Jin ^b   Chitu, Adrian M ^b   Komem, Yigal ^a,b   Rothschild, Avner ^a  

^a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY   (Israel)

^b Columbia University ^*  (United States)

Author keywords

grain boundaries; impedance spectroscopy; laser processing; Thin films; TiO 2

Indexed keywords

ELONGATED GRAINS; FERROELECTRIC MEMORY; GRAIN BOUNDARY TRANSPORT; GRAIN MORPHOLOGIES; IMPEDANCE SPECTROSCOPY; IMPEDANCE SPECTROSCOPY MEASUREMENTS; LASER INDUCED; LASER INDUCED MELTING; LASER PROCESSING; NEW DESIGN; PIEZOELECTRIC MICROSENSORS; SEQUENTIAL LATERAL SOLIDIFICATIONS; TEXTURED FILMS; TIO;

GRAIN BOUNDARIES; GRAIN SIZE AND SHAPE; MORPHOLOGY; THIN FILMS; TITANIUM DIOXIDE; TRANSPORT PROPERTIES;

FERROELECTRIC FILMS;

TITANIUM; TITANIUM DIOXIDE;

ARTICLE; CERAMICS; CHEMISTRY; CRYSTALLIZATION; LASER; PHASE TRANSITION;

CERAMICS; CRYSTALLIZATION; LASERS; PHASE TRANSITION; TITANIUM;

EID: 79960927260     PISSN: 09359648     EISSN: 15214095     Source Type: Journal    
DOI: 10.1002/adma.201100917     Document Type: Article

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