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Volumn , Issue , 2009, Pages 1007-1012

Unified analysis of diagnosis methods for process monitoring

Author keywords

Contribution analysis; Diagnosability; Fault diagnosis; Process monitoring

Indexed keywords

CONTRIBUTION ANALYSIS; DIAGNOSABILITY; DIAGNOSIS METHODS; FAULT MAGNITUDES; GENERAL METHOD; MONTE CARLO SIMULATION; SENSOR FAULT; STATISTICAL PROCESS MONITORING; UNIFIED ANALYSIS;

EID: 79960922249     PISSN: 14746670     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.3182/20090630-4-ES-2003.0183     Document Type: Conference Paper
Times cited : (20)

References (13)
  • 1
    • 79961018913 scopus 로고    scopus 로고
    • Reconstruction-based contribution for process monitoring
    • Seoul, Korea, July
    • C. Alcala and S. J. Qin. Reconstruction-based contribution for process monitoring. In Proceedings of 17th IFAC World Congress, Seoul, Korea, July 2008.
    • (2008) Proceedings of 17th IFAC World Congress
    • Alcala, C.1    Qin, S.J.2
  • 2
    • 67349245154 scopus 로고    scopus 로고
    • Reconstruction-based contribution for process monitoring
    • Accepted for publication on
    • Carlos F. Alcala and S. J. Qin. Reconstruction-based contribution for process monitoring. Accepted for publication on Automatica, 2009.
    • (2009) Automatica
    • Alcala, C.F.1    Qin, S.J.2
  • 3
    • 0000235653 scopus 로고
    • Some theorems on quadratic forms applied in the study of analysis of variance problems, I. Effect of inequality of variance in the one-way classification
    • G.E.P. Box. Some theorems on quadratic forms applied in the study of analysis of variance problems, I. effect of inequality of variance in the one-way classification. Ann. Math. Statistics, 25:290-302, 1954.
    • (1954) Ann. Math. Statistics , vol.25 , pp. 290-302
    • Box, G.E.P.1
  • 4
    • 33646731122 scopus 로고    scopus 로고
    • Multiblock principal component analysis based on a combined index for semiconductor fault detection and diagnosis
    • G. Cherry and S. J. Qin. Multiblock principal component analysis based on a combined index for semiconductor fault detection and diagnosis. IEEE Trans. on Semiconductor Manufacturing, 19(2):159-172, 2006.
    • (2006) IEEE Trans. on Semiconductor Manufacturing , vol.19 , Issue.2 , pp. 159-172
    • Cherry, G.1    Qin, S.J.2
  • 5
    • 0003216796 scopus 로고
    • Contribution plots: The missing link in multivariate quality control
    • Milwaukee, WI
    • P. Miller, R.E. Swanson, and C.F. Heckler. Contribution plots: the missing link in multivariate quality control. In Fall Conf. of the ASQC and ASA, 1993. Milwaukee, WI.
    • (1993) Fall Conf. of the ASQC and ASA
    • Miller, P.1    Swanson, R.E.2    Heckler, C.F.3
  • 6
    • 0002970413 scopus 로고    scopus 로고
    • Statistical monitoring of batch processes
    • Anaheim, CA, August
    • P. Nomikos. Statistical monitoring of batch processes. In Preprints of Joint Statistical Meeting, Anaheim, CA, August 1997.
    • (1997) Preprints of Joint Statistical Meeting
    • Nomikos, P.1
  • 7
    • 0029252734 scopus 로고
    • Multivariate SPC charts for monitoring batch processes
    • P. Nomikos and J.F. MacGregor. Multivariate SPC charts for monitoring batch processes. Technometrics, 37(1): 41-59, 1995.
    • (1995) Technometrics , vol.37 , Issue.1 , pp. 41-59
    • Nomikos, P.1    MacGregor, J.F.2
  • 8
    • 0242354134 scopus 로고    scopus 로고
    • Statistical process monitoring: Basics and beyond
    • S. J. Qin. Statistical process monitoring: Basics and beyond. J. Chemometrics, 17:480-502, 2003.
    • (2003) J. Chemometrics , vol.17 , pp. 480-502
    • Qin, S.J.1
  • 9
    • 0001282938 scopus 로고    scopus 로고
    • On unifying multiblock analysis with application to decentralized process monitoring
    • DOI 10.1002/cem.667
    • S. J. Qin, S. Valle-Cervantes, and M. Piovoso. On unifying multi-block analysis with applications to decentralized process monitoring. J. Chemometrics, 15:715-742, 2001. (Pubitemid 33608039)
    • (2001) Journal of Chemometrics , vol.15 , Issue.9 , pp. 715-742
    • Qin, S.J.1    Valle, S.2    Piovoso, M.J.3
  • 10
    • 0030127409 scopus 로고    scopus 로고
    • Statistical Process Monitoring and Disturbance Diagnosis in Multivariable Continuous Processes
    • A. Raich and A. Cinar. Statistical process monitoring and disturbance diagnosis in multivariate continuous processes. AIChE J., 42:995-1009, 1996. (Pubitemid 126468139)
    • (1996) AIChE Journal , vol.42 , Issue.4 , pp. 995-1009
    • Raich, A.1    Cinar, A.2
  • 12
    • 0030530039 scopus 로고    scopus 로고
    • The process chemometrics approach to process monitoring and fault detection
    • DOI 10.1016/0959-1524(96)00009-1, PII S0950152496000091
    • B.M. Wise and N.B. Gallagher. The process chemometrics approach to process monitoring and fault detection. J. Proc. Cont., 6:329-348, 1996. (Pubitemid 126375552)
    • (1996) Journal of Process Control , vol.6 , Issue.6 , pp. 329-348
    • Wise, B.M.1    Gallagher, N.B.2
  • 13
    • 0035427805 scopus 로고    scopus 로고
    • Fault diagnosis with multivariate statistical models part I: Using steady state fault signatures
    • DOI 10.1016/S0959-1524(00)00008-1, PII S0959152400000081
    • S. Yoon and J.F. MacGregor. Fault diagnosis with multi-variate statistical models, part I: using steady state fault signatures. J. Proc. Cont., 11:387-400, 2001. (Pubitemid 32408863)
    • (2001) Journal of Process Control , vol.11 , Issue.4 , pp. 387-400
    • Yoon, S.1    MacGregor, J.F.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.