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Volumn , Issue , 2009, Pages 1515-1520

Fault diagnosis based on hazard identification results

Author keywords

Diagnosis; Diagnostic inference; Fault diagnosis; Fault isolation; FMEA; Hazard identification; HAZOP; Large scale systems; Process systems; Reasoning

Indexed keywords

DIAGNOSTIC INFERENCE; FAULT ISOLATION; FMEA; HAZARD IDENTIFICATION; HAZOP; PROCESS SYSTEM; REASONING;

EID: 79960901318     PISSN: 14746670     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.3182/20090630-4-ES-2003.0104     Document Type: Conference Paper
Times cited : (4)

References (10)
  • 2
    • 76149110377 scopus 로고    scopus 로고
    • The P3 formalism: A basis for improved diagnosis in complex systems
    • Melbourne, Australia, page on CD
    • I.T. Cameron, B. Seligmann, K.M. Hangos, R. Lakner, and E. Németh. The P3 formalism: A basis for improved diagnosis in complex systems. In CHEMECA Conference 2007, Melbourne, Australia, page on CD, 2007.
    • (2007) CHEMECA Conference 2007
    • Cameron, I.T.1    Seligmann, B.2    Hangos, K.M.3    Lakner, R.4    Németh, E.5
  • 3
    • 35148839490 scopus 로고
    • A translation approach to portable ontology specification
    • T.R. Gruber. A translation approach to portable ontology specification. Knowledge Acquisition, 5:199-220, 1993.
    • (1993) Knowledge Acquisition , vol.5 , pp. 199-220
    • Gruber, T.R.1
  • 8
    • 0037443771 scopus 로고    scopus 로고
    • A review of process fault detection and diagnosis part II: Qualitative models and search strategies
    • DOI 10.1016/S0098-1354(02)00161-8, PII S0098135402001618
    • V. Venkatasubramanian, R. Rengaswamy, and S.N. Kavuri. A review of process fault detection and diagnosis Part II: Qualitative models and search strategies. Computers and Chemical Engineering, 27:313-326, 2003a. (Pubitemid 36285963)
    • (2003) Computers and Chemical Engineering , vol.27 , Issue.3 , pp. 313-326
    • Venkatasubramanian, V.1    Rengaswamy, R.2    Kavuri, S.N.3
  • 9
    • 0037443803 scopus 로고    scopus 로고
    • A review of process fault detection and diagnosis part III: Process history based methods
    • DOI 10.1016/S0098-1354(02)00162-X, PII S009813540200162X
    • V. Venkatasubramanian, R. Rengaswamy, S.N. Kavuri, and K. Yin. A review of process fault detection and diagnosis Part III: Process history based methods. Computers and Chemical Engineering, 27:327-346, 2003b. (Pubitemid 36285964)
    • (2003) Computers and Chemical Engineering , vol.27 , Issue.3 , pp. 327-346
    • Venkatasubramanian, V.1    Rengaswamy, R.2    Kavuri, S.N.3    Yin, K.4
  • 10
    • 0037443770 scopus 로고    scopus 로고
    • A review of process fault detection and diagnosis part I: Quantitative model-based methods
    • DOI 10.1016/S0098-1354(02)00160-6, PII S0098135402001606
    • V. Venkatasubramanian, R. Rengaswamy, K. Yin, and S.N. Kavuri. A review of process fault detection and diagnosis Part I: Quantitative model-based methods. Computers and Chemical Engineering, 27:293-311, 2003c. (Pubitemid 36285962)
    • (2003) Computers and Chemical Engineering , vol.27 , Issue.3 , pp. 293-311
    • Venkatasubramanian, V.1    Rengaswamy, R.2    Yin, K.3    Kavuri, S.N.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.