Modeling of carbon nanotube (CNT) interconnects

2011 IEEE 15th Workshop on Signal Propagation on Interconnects, SPI 2011 - Proceedings

Volumn , Issue , 2011, Pages 79-82

  Yin, Wen Yan ^a,b   Zhao, Wen Sheng ^a  

^a ZHEJIANG UNIVERSITY   (China)

^b SHANGHAI JIAO TONG UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CROSSTALK EFFECT; DOUBLE-WALLED CNT; ELECTROTHERMAL CHARACTERIZATION; EQUIVALENT CIRCUIT MODEL; INTERCONNECT ARCHITECTURES; INTERCONNECT ARRAYS; METALLIC CARBON NANOTUBES; SELF-HEATING EFFECT;

CROSSTALK; DELAY CIRCUITS;

CARBON NANOTUBES;

EID: 79960899233     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SPI.2011.5898845     Document Type: Conference Paper

References (13)

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