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Volumn 13, Issue , 2011, Pages

High-fidelity state detection and tomography of a single-ion Zeeman qubit

Author keywords

[No Author keywords available]

Indexed keywords

DETECTION ERROR; DETECTION PROCESS; FAULT-TOLERANT COMPUTATION; FLUORESCENCE DETECTION; HIGH FIDELITY; HIGH-PRECISION; METASTABLE LEVELS; NARROW-LINE WIDTH; QUANTUM PROCESS TOMOGRAPHY; QUBIT READ-OUT; QUBIT STATE; SINGLE-ION; SINGLE-QUBIT STATE; STATE DETECTION; STATE TOMOGRAPHY;

EID: 79960811117     PISSN: 13672630     EISSN: None     Source Type: Journal    
DOI: 10.1088/1367-2630/13/7/073027     Document Type: Article
Times cited : (44)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.