Electronic and defect structures of CuSCN

Journal of Physical Chemistry C

Volumn 114, Issue 19, 2010, Pages 9111-9117

  Jaffe, John E ^a   Kaspar, Tiffany C ^a   Droubay, Timothy C ^a   Varga, Tamas ^a   Bowden, Mark E ^a   Exarhos, Gregory J ^a  

^a PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BONDING CHARACTERISTICS; CONDUCTION-BAND MINIMUM; COPPER THIOCYANATES; ELECTRON EFFECTIVE MASS; HOLE EFFECTIVE MASS; OPTICAL ABSORPTION MEASUREMENT; PHOTOVOLTAIC APPLICATIONS; VALENCE BAND SPECTRA;

CHEMISTRY; PHYSICAL CHEMISTRY;

COPPER;

EID: 79960800340     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp101586q     Document Type: Article

References (37)

1. Exarhos, G. J.; Zhou, X. D. Thin Solid Films 2007, 515, 7025.
2. Granqvist, C. G. Sol. Energy Mater. Sol. Cells 2007, 91, 1529.
3. Banerjee, A. N.; Chattopadhyay, K. K. Prog. Cryst. Growth Charact. 2005, 50, 52.
4. Tennakone, K.; Ariyasingha, W. M. Electrochim. Acta 1980, 25, 731.
5. Snaith, H. J.; Schmidt-Mende, L. Adv. Mater. 2007, 19, 3187.
6. O'Regan, B.; Schwartz, D. T.; Zakeeruddin, S. M.; Gratzel, M. Adv. Mater. 2000, 12, 1263.
7. Levy-Clement, C.; Tena-Zaera, R.; Ryan, M. A.; Katty, A.; Hodes, G. Adv. Mater. 2005, 17, 1512.
8. Dittrich, T.; Kieven, D.; Belaidi, A.; Rusu, M.; Tornow, J.; Schwarzburg, K.; Lux-Steiner, M. C. J. Appl. Phys. 2009, 105, 034509.
9. Tennakone, K.; Jayatissa, A. H.; Fernando, C. A. N.; Wickramanayake, S.; Punchihewa, S.; Weerasena, L. K.; Premasiri, W. D. R. Phys. Status Solidi A 1987, 103, 491.
10. Perera, V. P. S.; Senevirathna, M. K. I.; Pitigala, P. K. D. D. P.; Tennakone, K. Sol. Energy Mater. Sol. Cells 2005, 86, 443.
11. Frost, D. C.; Kirby, C.; Lau, W. M.; MacDonald, C. B.; McDowell, C.; Westwood, N. P. C. Chem. Phys. Lett. 1980, 69, 1.
12. Smith, D. L.; Saunders, V. I. Acta Crystallogr. 1982, B38, 907.
13. Smith, D. L.; Saunders, V. I. Acta Crystallogr. 1981, B37, 1807.
14. Kabesova, M.; Dunaj-Jurco, M.; Serator, M.; Gazo, J.; Garaj, J. Inorg. Chim. Acta 1976, 17, 161.
15. Kresse, G.; Furthmüller, J. Comput. Mater. Sci. 1996, 6, 15.
16. Kresse, G.; Furthmüller, J. Phys. Rev. B 1996, 54, 11169.
17. Kresse, G.; Hafner, J. Phys. Rev. B 1993, 47, 558.
18. Kresse, G.; Hafner, J. Phys. Rev. B 1993, 48, 13115.
19. Kresse, G.; Hafner, J. Phys. Rev. B 1994, 49, 142518.
20. Kresse, G.; Hafner, J. J. Phys.: Condens. Matter 1994, 6, 8245.
21. See also http://cms.mpi.univie.ac.at/vasp/.
22. Blöchl, P. E. Phys. Rev. B 1994, 50, 17953.
23. Monkhorst, H. J.; Pack, J. D. Phys. Rev. B 1976, 13, 5188.
24. Perdew, J. P.; Burke, K.; Ernzerhof, M. Phys. Rev. Lett. 1996, 77, 3865.
25. Lany, S.; Zunger, A. Phys. Rev. B 2008, 78, 235104.
26. Victora, R. H. Phys. Rev. B 1997, 56, 4417.
27. Zhang, S. B.; Wei, S.-H.; Zunger, A. Phys. Rev. Lett. 1997, 78, 4059.
28. Zhang, S. B.; Wei, S.-H.; Zunger, A.; Katayama-Yoshida, H. Phys. Rev. B 1998, 57, 9642.
29. Wagner, C. D.; Davis, L. E.; Zeller, M. V.; Taylor, J. A.; Raymond, R. H.; Gale, L. H. Surf. Interface Anal. 1981, 3, 211.
30. Castle, J. E. J. Vac. Sci. Technol., A 2007, 25, 1.
31. Ronning, C.; Feldermann, H.; Merk, R.; Hofsass, H.; Reinke, P.; Thiele, J.-U. Phys. Rev. B 1998, 58, 2207.
32. Poulston, S.; Parlett, P. M.; Stone, P.; Bowker, M. Surf. Interface Anal. 1996, 24, 811.
33. Jiang, Z. T.; Thurgate, S. M.; Wilkie, P. Surf. Interface Anal. 2001, 31, 287.
34. Andrews, P. T.; Hisscott, L. A. J. Phys. F: Met. Phys. 1975, 5, 1568.
35. Ni, Y.; Jin, Z.; Fu, Y. J. Am. Ceram. Soc. 2007, 90, 2966.
36. Gao, X. D.; Li, X. M.; Yu, W. D.; Qiu, J. J.; Gan, X. Y. Thin Solid Films 2008, 517, 554.
37. Wu, W.; Jin, Z.; Hua, Z.; Fu, Y.; Qiu, J. Electrochim. Acta 2005, 50, 2343.