Piezoelectric response of relaxor solid solution Na0.5Bi 0.5TiO3-BaTiO3 single crystal grown by bridgman method

Ferroelectrics

Volumn 415, Issue 1, 2011, Pages 67-74

  Yasuda, N ^a   Otsuka, S ^a   Ohwa, H ^a   Fujita, K ^b   Iwata, M ^c   Terauchi, H ^d   Ishibashi, Y ^e  

^a GIFU UNIVERSITY   (Japan)

^b GIFU NATIONAL COLLEGE OF TECHNOLOGY   (Japan)

^c NAGOYA INSTITUTE OF TECHNOLOGY   (Japan)

^d KWANSEI GAKUIN UNIVERSITY   (Japan)

^e KYUSHU UNIVERSITY   (Japan)

Author keywords

Bi based relaxor solid solution single crystal; Coercive field; Domain switching; Lattice defects; Random fields

Indexed keywords

COERCIVE FIELD; DOMAIN SWITCHINGS; DOMAIN-SWITCHING; MICROSCOPIC OBSERVATIONS; PIEZOELECTRIC RESPONSE; PIEZORESPONSE; PIEZORESPONSE FORCE MICROSCOPY; RANDOM FIELDS; RELAXORS; TIO;

BARIUM; BARIUM COMPOUNDS; COERCIVE FORCE; CRYSTAL GROWTH FROM MELT; DEFECTS; FERROELECTRICITY; OXYGEN VACANCIES; SINGLE CRYSTALS; SOLIDIFICATION; SWITCHING;

SOLID SOLUTIONS;

EID: 79960714163     PISSN: 00150193     EISSN: 15635112     Source Type: Journal    
DOI: 10.1080/00150193.2011.577373     Document Type: Conference Paper

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