Linewidth roughness in nanowire-mask-based graphene nanoribbons

Applied Physics Letters

Volumn 98, Issue 24, 2011, Pages

  Xu, Guangyu ^a   Torres Jr , Carlos M ^a   Bai, Jingwei ^a   Tang, Jianshi ^a   Yu, Tao ^b   Huang, Yu ^a   Duan, Xiangfeng ^a   Zhang, Yuegang ^c   Wang, Kang L ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b PEKING UNIVERSITY   (China)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DEVICE PERFORMANCE; GRAPHENE NANORIBBONS; LINEWIDTH ROUGHNESS; ON/OFF RATIO;

GRAPHENE; NANOWIRES; TRANSPORT PROPERTIES;

ROUGHNESS MEASUREMENT;

EID: 79960600263     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3599596     Document Type: Article

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