Breakdown spectroscopy induced by localized microwaves for material identification

Microwave and Optical Technology Letters

Volumn 53, Issue 10, 2011, Pages 2281-2283

  Meir, Yehuda ^a   Jerby, Eli ^a  

^a TEL AVIV UNIVERSITY   (Israel)

Author keywords

atomic emission; breakdown spectroscopy; microwave drill; microwave hotspot; plasma

Indexed keywords

ATOMIC EMISSION; ATOMIC EMISSION SPECTRA; BREAKDOWN SPECTROSCOPY; DIRECT CONTACT; DIRECT EXCITATION; HOT SPOT; MATERIAL IDENTIFICATION; MATERIAL SURFACE; MICROWAVE DRILL; MICROWAVE DRILLS; MICROWAVE ENERGIES; MICROWAVE TECHNIQUE; OPTICAL SPECTROMETERS; SOLID MATERIAL;

ATOMS; DRILLS; EMISSION SPECTROSCOPY; MATERIALS; MICROWAVES; OPTICAL EMISSION SPECTROSCOPY; SPECTROMETERS; SPECTROSCOPIC ANALYSIS;

ATOMIC SPECTROSCOPY;

EID: 79960570785     PISSN: 08952477     EISSN: 10982760     Source Type: Journal    
DOI: 10.1002/mop.26272     Document Type: Article

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