Melt memory effects on recrystallization of polyamide 6 revealed by depolarized light scattering and small-angle X-ray scattering

Journal of Applied Polymer Science

Volumn 122, Issue 3, 2011, Pages 1913-1920

  Kawabata, Jun ^a   Matsuba, Go ^b   Nishida, Koji ^a   Inoue, Rintaro ^a   Kanaya, Toshiji ^a  

^a KYOTO UNIVERSITY   (Japan)

^b YAMAGATA UNIVERSITY   (Japan)

Author keywords

annealing; crystallization; light scattering; polyamides; SAXS

Indexed keywords

ANNEALING TEMPERATURES; DEPOLARIZED LIGHT SCATTERING; EQUILIBRIUM MELTING TEMPERATURE; INCUBATION PERIODS; LENGTH SCALE; LONG-TERM ANNEALING; MELT MEMORY EFFECTS; MEMORY EFFECTS; NUCLEATION RATE; POLYAMIDE 6; RELAXED STATE; SAXS; SHORT TERM; SMALL ANGLE X-RAY SCATTERING;

AMIDES; ANNEALING; CRYSTALLIZATION; HYDROGEN BONDS; LIGHT SCATTERING; MELTING POINT; METAL MELTING; NUCLEATION; POLYETHYLENES; RECRYSTALLIZATION (METALLURGY); REFRACTION; X RAY SCATTERING;

SCATTERING;

EID: 79960566349     PISSN: 00218995     EISSN: 10974628     Source Type: Journal    
DOI: 10.1002/app.34294     Document Type: Article

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