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Volumn 20, Issue 2, 2011, Pages 207-327

Derandomized Parallel Repetition via Structured PCPs

Author keywords

de Bruijn; derandomized parallel repetition; direct product; direct product test; low error; PCP

Indexed keywords


EID: 79960562417     PISSN: 10163328     EISSN: 14208954     Source Type: Journal    
DOI: 10.1007/s00037-011-0013-5     Document Type: Article
Times cited : (22)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.