Investigation of structural and electronic properties of graphene oxide

Applied Physics Letters

Volumn 99, Issue 1, 2011, Pages

  Saxena, Sumit ^a,f   Tyson, Trevor A ^a   Shukla, Shobha ^b,f   Negusse, Ezana ^c   Chen, Haiyan ^a   Bai, Jianming ^d,e  

^a NEW JERSEY INSTITUTE OF TECHNOLOGY   (United States)

^b the State University of New York   (United States)

^c MONTANA STATE UNIVERSITY   (United States)

^d UNIVERSITY OF TENNESSEE   (United States)

^e OAK RIDGE NATIONAL LABORATORY   (United States)

^f HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONFINEMENT EFFECTS; IN-PLANE; LOCAL ATOMIC STRUCTURES; SELECTED-AREA ELECTRON DIFFRACTION MEASUREMENTS; STRUCTURAL COHERENCE; X-RAY ABSORPTION NEAR EDGE SPECTROSCOPY; X-RAY DIFFRACTION MEASUREMENTS;

ABSORPTION SPECTROSCOPY; DIFFRACTION; ELECTRONIC PROPERTIES; PHOTONIC DEVICES; SYNCHROTRON RADIATION; X RAY DIFFRACTION;

GRAPHENE;

EID: 79960540025     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3607305     Document Type: Article

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